Monitoring of depth distribution of trace elements by GDMS

Authors
de las Heras, LA Actis-Dato, OL Betti, M Toscano, EH Tocci, U Fuoco, R Giannarelli, S
Citation
La. De Las Heras et al., Monitoring of depth distribution of trace elements by GDMS, MICROCHEM J, 67(1-3), 2000, pp. 333-336
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
MICROCHEMICAL JOURNAL
ISSN journal
0026265X → ACNP
Volume
67
Issue
1-3
Year of publication
2000
Pages
333 - 336
Database
ISI
SICI code
0026-265X(200012)67:1-3<333:MODDOT>2.0.ZU;2-B
Abstract
The depth distribution of B and Li have been studied in ZrO2 layers by GDMS . Zr alloy has been corroded to ZrO2 in an autoclave in solutions containin g Li and B. Samples were collected at different reaction times and analyzed . The GDMS crater depth and the sputter rate could be determined by profilo metry for the discharge conditions used. In the analyzed samples three zone s could be identified: oxide, interface and zircaloy. The concentration of Li and B was followed in each of the three zones. (C) 2000 Elsevier Science B.V. All rights reserved.