Determination of the stopping power of channeled protons in SiO2 in the backscattering geometry

Citation
M. Kokkoris et al., Determination of the stopping power of channeled protons in SiO2 in the backscattering geometry, NUCL INST B, 173(4), 2001, pp. 411-416
Citations number
29
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
173
Issue
4
Year of publication
2001
Pages
411 - 416
Database
ISI
SICI code
0168-583X(200102)173:4<411:DOTSPO>2.0.ZU;2-C
Abstract
Energy spectra of protons channeling along the optical axis (c-axis) of a q uartz crystal in the energy region E-p = 1.7-2.5 MeV in the backscattering geometry were taken and analyzed. Computer simulations based on the assumpt ion that the dechanneling of protons follows an exponential law are in good agreement with the measured spectra. yielding electronic stopping powers F or the specific crystal orientation that vary between 2.35 and 1.74 eV/A, r espectively. for the energy interval in consideration. The results are comp ared with the ones obtained in the past for simpler crystallographic struct ures, namely Si [100] and Si [111], and an attempt is made to explain the o ccurring similarities as well as the differences. (C) 2001 Elsevier Science B.V. All rights reserved.