Phase imaging with a phase-shifting X-ray shearing interferometer using anX-ray line source

An X-ray shearing interferometer with a line source is presented. The line source broadens X-ray beams and enables us to obtain a phase image with an X-ray image sensor without mechanical scanning. It can reduce the measuring time compared with image acquisition by mechanical scanning. Small phase d ifference is measured with the phase shift method using acrylic wedges. Alt hough the output beam is overlapped with the non-interfering beams, we can obtain interference fringes with reasonable contrast. With this system we c an obtain a projected phase image of an acrylic plate with cellophane tape.