Throughput measurement of a multilayer-coated Schwarzschild objective using synchrotron radiation

Authors
Kiyokura, T Maeda, F Watanabe, Y Iketaki, Y Nagai, K Horikawa, Y Oshima, M Shigemasa, E Yagishita, A
Citation
T. Kiyokura et al., Throughput measurement of a multilayer-coated Schwarzschild objective using synchrotron radiation, OPT REV, 7(6), 2000, pp. 576-578
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICAL REVIEW
ISSN journal
13406000 → ACNP
Volume
7
Issue
6
Year of publication
2000
Pages
576 - 578
Database
ISI
SICI code
1340-6000(200011/12)7:6<576:TMOAMS>2.0.ZU;2-L
Abstract
The throughput of a Schwarzschild objective using undulator synchrotron rad iation was measured. Conventionally, the throughput was estimated from the squared reflectivity of one multilayer mirror and from the obstruction rati o. However, we evaluated the transmission ratio from the input and output p hoton flux using a precisely calibrated monochromatic beam from an undulato r light source. It was found that the objective has a maximum throughput of 8.5% at a wavelength of 13.9 nm.