Simultaneous measurements of the thickness and refractive index of microstructures in obscure specimen by optical coherence tomography

Citation
Gj. Song et al., Simultaneous measurements of the thickness and refractive index of microstructures in obscure specimen by optical coherence tomography, OPTIK, 111(12), 2000, pp. 541-543
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTIK
ISSN journal
00304026 → ACNP
Volume
111
Issue
12
Year of publication
2000
Pages
541 - 543
Database
ISI
SICI code
0030-4026(2000)111:12<541:SMOTTA>2.0.ZU;2-#
Abstract
A novel technique based on optical coherence tomography (OCT) is presented to measure the microstructure and refractive index of inhomogeneous obscure specimen simultaneously. In inhomogeneous specimens, refractive index of o ne component, whose position is not known, is different from that of its su rrounding components. The microstructure and refractive index of a multimod e fiber and a lotus root specimen were measured by this technique. The resu lts verify the feasibility of this method.