Local-structure analysis around dopant atoms using multiple energy x-ray holography - art. no. 041201

We used multiple energy x-ray holography (MEXH) to image the local atomic e nvironment of Zn atoms doped in a GaAs wafer using synchrotron radiation an d a multielement solid-state detector. The obtained atomic images revealed that the Zn atoms occupied substitutional site. By the comparison of the re constructed images 1.41 Angstrom above and below the emitter atom, the supp ression of twin images due to MEXH was confirmed experimentally for certain atoms.