Nucleation and growth kinetics in semiconductor chemical vapor deposition - art. no. 041302

Citation
J. Spitzmuller et al., Nucleation and growth kinetics in semiconductor chemical vapor deposition - art. no. 041302, PHYS REV B, 6304(4), 2001, pp. 1302
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6304
Issue
4
Year of publication
2001
Database
ISI
SICI code
0163-1829(20010115)6304:4<1302:NAGKIS>2.0.ZU;2-Q
Abstract
We have studied the kinetics of nucleation and growth during Si/Si(100)-(2 x 1) homoepitaxy by ultrahigh vacuum chemical vapor deposition from SiH4, e mploying scanning tunneling microscopy and comparative rate equation simula tions of the growth processes. Island formation in this highly complex syst em, in the presence of mobile hydrogen and other metastable SiHx species, i s analyzed and compared to molecular-beam epitaxy growth and predictions fr om established rate equation theory. The deviations from classical theory c an be understood by taking into account the kinetics of the SiH4 dissociati on cascade thar leads to epitaxial Si growth.