The electronic and optical properties of Si/SiO2 superlattices: role of confined and defect states

Citation
E. Degoli et S. Ossicini, The electronic and optical properties of Si/SiO2 superlattices: role of confined and defect states, SURF SCI, 470(1-2), 2000, pp. 32-42
Citations number
29
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
470
Issue
1-2
Year of publication
2000
Pages
32 - 42
Database
ISI
SICI code
0039-6028(200012)470:1-2<32:TEAOPO>2.0.ZU;2-Z
Abstract
The Si layer thickness dependence of the optical properties of silicon/sili con dioxide (Si/SiO2) superlattices has been, for the first time, theoretic ally investigated. In our first principle calculation we consider both full y passivated interfaces and the presence of oxygen vacancy at the interface . Our results show the key role played both by the quantum confined states and interface states in the experimentally observed visible luminescence in Si/SiO2 confined systems. (C) 2000 Elsevier Science B.V. All rights reserv ed.