Atomic surface characterisation and modification of the layered compounds Bi2Se3, Bi1.9Sb0.1Se3 and Bi1.6Sb0.4Se3

Citation
Sa. Contera et al., Atomic surface characterisation and modification of the layered compounds Bi2Se3, Bi1.9Sb0.1Se3 and Bi1.6Sb0.4Se3, ULTRAMICROS, 86(1-2), 2001, pp. 55-61
Citations number
12
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ULTRAMICROSCOPY
ISSN journal
03043991 → ACNP
Volume
86
Issue
1-2
Year of publication
2001
Pages
55 - 61
Database
ISI
SICI code
0304-3991(200101)86:1-2<55:ASCAMO>2.0.ZU;2-I
Abstract
In this work, we show atomic STM images of the layered compound Bi2Se3. We study the effect in the surface of the substitution of 5% and 20% of the Bi atoms for Sb in Bi1.9Sb0.1Se3 and Bi1.6Sb0.4Se3, The images of the three s amples show similar trigonal structures corresponding probably to the van d er Waals Se atoms. The distance measured between surface atoms in Bi2Se3 is 4.04 Angstrom, in Bi1.9Sb0.1Se3 is 4.16 Angstrom and in Bi1.6Sb0.4Se3 is 4 .26 Angstrom. In Bi1.6Sb0.4Se3 some atomic sites appear brighter than other s. The effect is accentuated at higher tunnelling currents and is nut obser ved in the other compounds. Nanoscopic range depressions on the sample migh t be related to the skeletal crystal structure since the images show atomic corrugations that align slightly in one direction. We explain the results as the effects of the interactions between tip and sample, and discuss two interpretations: on the one hand. localised depression of the individual at omic sites, and on the other the possible elevation of the atoms of the sur face due to a phase transition of the compounds induced by STM. (C) 2001 El sevier Science B.V. All rights reserved.