Solid state amorphization in cold drawn Cu/Nb wires

Authors
Sauvage, X Renaud, L Deconihout, B Blavette, D Ping, DH Hono, K
Citation
X. Sauvage et al., Solid state amorphization in cold drawn Cu/Nb wires, ACT MATER, 49(3), 2001, pp. 389-394
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
ACTA MATERIALIA
ISSN journal
13596454 → ACNP
Volume
49
Issue
3
Year of publication
2001
Pages
389 - 394
Database
ISI
SICI code
1359-6454(20010208)49:3<389:SSAICD>2.0.ZU;2-U
Abstract
The microstructure of cold drawn Cu/Nb nanocomposite wires was investigated using a three dimensional atom probe (3D-AP) and transmission electron mic roscopy (TEM). Although there is no solubility between Nb and Cu in the equ ilibrium state, atom probe analysis results revealed that intermixing occur s between Nh and Cu filaments as a result of cold drawing with a large stra in. High resolution transmission electron microscopy (HRTEM) results reveal ed that an amorphous layer is formed along some Cu/Nb interfaces. This soli d state amorphization is compared with similar reactions observed in Cu-Nb multilayers. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Lt d. All rights reserved.