A microstructure function, G(x), is introduced as a general description of
microstructure by considering simultaneously the spatial arrangement of pha
ses, i(x), of crystallographic orientations, g(x), as well as the lattice d
efects and residual stress, D(x). Particular emphasis is laid on The orient
ation-location distribution function, g(x), which is the quantification of
orientation stereology. From this function the classical texture as well as
the classical (grain) stereology can be derived (but not vice versa). Rece
ntly new techniques of diffraction scanning electron microscopy have been d
eveloped for the acquisition of g(x) with the scanning electron microscopy
(SEM) and transmission.