IDENTIFYING LAYER SWITCHING IN MAGNETIC MULTILAYERS WITH X-RAY RESONANT MAGNETIC SCATTERING

Authors
FREELAND JW CHAKARIAN V IDZERDA YU DOHERTY S ZHU JG PARK JH KAO CC
Citation
Jw. Freeland et al., IDENTIFYING LAYER SWITCHING IN MAGNETIC MULTILAYERS WITH X-RAY RESONANT MAGNETIC SCATTERING, Applied physics letters, 71(2), 1997, pp. 276-278
Citations number
24
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
71
Issue
2
Year of publication
1997
Pages
276 - 278
Database
ISI
SICI code
0003-6951(1997)71:2<276:ILSIMM>2.0.ZU;2-L
Abstract
The order of layer switching in a NiFe/Cu/Co spin valve is determined directly using circular polarized x-ray resonant magnetic scattering. By monitoring changes in the angular dependence of the magnetic contri butions to the reflectivity near the Fe L-3 and Co L-3 edges asa funct ion of applied field, the order of layer switching is directly obtaine d. (C) 1997 American Institute of Physics.