Microstructural investigations of Y2O3 thin films deposited by laser ablation on MgO

Citation
Rj. Gaboriaud et al., Microstructural investigations of Y2O3 thin films deposited by laser ablation on MgO, APPL PHYS A, 71(6), 2000, pp. 675-680
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN journal
09478396 → ACNP
Volume
71
Issue
6
Year of publication
2000
Pages
675 - 680
Database
ISI
SICI code
0947-8396(200012)71:6<675:MIOYTF>2.0.ZU;2-F
Abstract
The epitaxial relationships and the microstructure of thin Y2O3 fillm, in S itu grown by laser ablation at 700 degreesC under 0.5 mbar oxygen pressure on MgO substrate, are studied by X-lay and HRTEM investigations. X-ray phi -scan experiments show that Y2O3 exhibits two different crystallographic gr owing directions (111) and (100) on (100) single-crystalline MgO substrate. The (111) growing direction appears with four different epitaxial relation ships where the (110) Y2O3 in-plane direction is parallel to the (110) inpl ane direction of MgO. The (100) growing direction appears with one epitaxia l relationship, cube Y2O3 on cube MgO. The HRTEM experiments show the colum nar aspect of the Y2O3 thin film. Both (111) and (100) Y2O3-oriented grains are observed in good agreement with the X-ray experiments.