Effects of ambient pressure on silicon nanowire growth

Citation
Xh. Fan et al., Effects of ambient pressure on silicon nanowire growth, CHEM P LETT, 334(4-6), 2001, pp. 229-232
Citations number
14
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CHEMICAL PHYSICS LETTERS
ISSN journal
00092614 → ACNP
Volume
334
Issue
4-6
Year of publication
2001
Pages
229 - 232
Database
ISI
SICI code
0009-2614(20010209)334:4-6<229:EOAPOS>2.0.ZU;2-L
Abstract
Growth of silicon nanowires (SiNWs) by thermal evaporation of SiO in a clos ed system was studied. The yield of SiNWs obtained in the present closed sy stem was much higher than that from the previous open systems. As the ambie nt pressure increased, the yield of SiNWs decreased and the diameter of the SiNWs increased, but the surface of the SiNWs was roughened. Transmission electron microscopic examination showed that the originally smooth surface of SiNWs was roughened by the formation of Si nano-particles. The implicati on of these results on the growth mechanism of the SiNWs is discussed. (C) 2001 Elsevier Science B.V. All rights reserved.