Growth of silicon nanowires (SiNWs) by thermal evaporation of SiO in a clos
ed system was studied. The yield of SiNWs obtained in the present closed sy
stem was much higher than that from the previous open systems. As the ambie
nt pressure increased, the yield of SiNWs decreased and the diameter of the
SiNWs increased, but the surface of the SiNWs was roughened. Transmission
electron microscopic examination showed that the originally smooth surface
of SiNWs was roughened by the formation of Si nano-particles. The implicati
on of these results on the growth mechanism of the SiNWs is discussed. (C)
2001 Elsevier Science B.V. All rights reserved.