Static vapor pressure measurement of low volatility precursors for molecular vapor deposition below ambient temperature

Citation
T. Ohta et al., Static vapor pressure measurement of low volatility precursors for molecular vapor deposition below ambient temperature, CHEM VAPOR, 7(1), 2001, pp. 33-37
Citations number
32
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
CHEMICAL VAPOR DEPOSITION
ISSN journal
09481907 → ACNP
Volume
7
Issue
1
Year of publication
2001
Pages
33 - 37
Database
ISI
SICI code
0948-1907(200101)7:1<33:SVPMOL>2.0.ZU;2-E
Abstract
Static vapor pressure measurements of volatile metal precursors, in the pre ssure range 10(-1) Pa to 10(3) Pa, are described. The vapor pressures and t he sublimation or evaporation enthalpies, in the range 265 K-300 K, of Mo(C O)(6) (77.7 kJ mol(-1)), two dimethyl(beta -diketonato)gold(III) complexes, Me2Au(tfa) (83.5 kJ mol(-1)) and Me2Au(hfa) (68.1 kJ mol(-1)), and an inor ganic Rh precursor, [(PF3)(2)RhCl](2) (90.8 kJ mol(-1)), were determined. T he sublimation enthalpy for Mo(CO)(6) was larger by more than 10 % in the m easured temperature range than reported values measured at higher temperatu res. At ambient temperatures, partial decomposition was observed only for t he gold precursors.