Conduction mechanism in CuxFe3-xO4

Authors
Patil, AN Mahajan, RP Patankar, KK Ghatage, AK Mathe, VL Patil, SA
Citation
An. Patil et al., Conduction mechanism in CuxFe3-xO4, I J PA PHYS, 38(9), 2000, pp. 651-656
Citations number
9
Categorie Soggetti
Physics
Journal title
INDIAN JOURNAL OF PURE & APPLIED PHYSICS
ISSN journal
00195596 → ACNP
Volume
38
Issue
9
Year of publication
2000
Pages
651 - 656
Database
ISI
SICI code
0019-5596(200009)38:9<651:CMIC>2.0.ZU;2-Y
Abstract
The electrical resistivity and thermoelectric power measurements as a funct ion of temperature are carried out for the system CuxFe3-xO4 with x = 1, 0. 8, 0.6, 0.4 and 0.2. The lattice constants of the phases are evaluated from X- ray powder data. The thermoelectric powder measurement indicates that t he samples are n-type semiconductor and the conduction mechanism is associa ted with the polaron hopping. The dielectric behaviour is found to he abnor mal and this is explained on the basis of Koop's model.