In situ high-pressure x-ray diffraction study of icosahedral Al-Cu-TM (TM = V, Cr, M) alloys

Citation
U. Ponkratz et al., In situ high-pressure x-ray diffraction study of icosahedral Al-Cu-TM (TM = V, Cr, M) alloys, J PHYS-COND, 13(4), 2001, pp. 549-555
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
13
Issue
4
Year of publication
2001
Pages
549 - 555
Database
ISI
SICI code
0953-8984(20010129)13:4<549:ISHXDS>2.0.ZU;2-J
Abstract
Icosahedral AI-Cu-TM (TM: transition metals = V, Cr, Mn) alloys were obtain ed by single-roller melt-spinning in a protective inert-gas atmosphere. The high-pressure properties up to 20 GPa were investigated by in situ energy- dispersive x-ray diffraction at a synchrotron source using a gas-membrane d iamond-anvil cell. No phase transitions could be observed. The bulk modulus of the Al-Cu-TM quasicrystalline phases was found to increase with the Hum e-Rothery factor. Moreover, the bulk modulus of the quasicrystalline phase is imposed by the bulk modulus of the transition metal element. The derived values for the first pressure derivative B'(0) indicate strong anharmonic contributions in the lattice potentials.