A generalized model for the lifetime of microelectronic components, applied to storage conditions

To improve the quality of microcircuit lifetime prediction in storage and n on-operating conditions, a new model, based on physical principles and gene rally applicable to microcircuits, is proposed. This model is derived from the Fundamentals of manufacturing yield statistics and uses compound Poisso n statistics with a time-dependent negative binomial shaping function. Comp arison of the model to statistical distributions created from available dat a shows that the model is applicable to many situations that may occur in a ctual populations. (C) 2001 Elsevier Science Ltd. All rights reserved.