Module allocation with idle-time utilization for on-line testability

Citation
Aa. Ismaeel et al., Module allocation with idle-time utilization for on-line testability, MICROEL REL, 41(2), 2001, pp. 323-332
Citations number
13
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
41
Issue
2
Year of publication
2001
Pages
323 - 332
Database
ISI
SICI code
0026-2714(200102)41:2<323:MAWIUF>2.0.ZU;2-X
Abstract
This paper presents a module allocation technique to improve on-line testab ility of a data path. The technique assigns multi-type operations to module s. Types of modules and count of each type of module, needed to synthesize a given scheduled data flow graph (SDFG) must be known a priori. The testin g utilizes idle time of modules. The objective is to test each type of oper ation assigned to a module. Testing time is reduced by minimizing the numbe r of types of operations assigned to a module. Certain operations called id le-time operations are scheduled in the SDFG and assigned to modules in the ir idle time to enhance testing. Ideally, one idle-time operation is requir ed for each type of operation assigned to the module. The technique minimiz es number of types of operations assigned to each module and creates suffic ient idle time. Promising results are obtained on benchmark examples. (C) 2 001 Elsevier Science Ltd. All rights reserved.