Material uniformity of CdZnTe grown by low-pressure Bridgman

Authors
Greaves, CM Brunett, BA Van Scyoc, JM Schlesinger, TE James, RB
Citation
Cm. Greaves et al., Material uniformity of CdZnTe grown by low-pressure Bridgman, NUCL INST A, 458(1-2), 2001, pp. 96-103
Citations number
4
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
458
Issue
1-2
Year of publication
2001
Pages
96 - 103
Database
ISI
SICI code
0168-9002(20010201)458:1-2<96:MUOCGB>2.0.ZU;2-F
Abstract
We have employed Low-Temperature Photoluminescence (LTPL) and Room-Temperat ure Photoluminescence Mapping (RTPLM) to explore the crystalline quality an d material uniformity of Cadmium Zinc Telluride (CZT) radiation detector ma terial grown by the Low-Pressure Bridgman (LPB) technique. We report on the differences in crystalline quality and uniformity of material supplied by eV Products Inc. and IMARAD Imaging Systems Ltd. In addition, we have exami ned the general detector response of the material supplied by IMARAD. We re port on the uniformity of the detector response and the temperature depende nce of this response when used as a detector, (C) 2001 Elsevier Science B.V . All rights reserved.