Component selection for a compact micro-XRF spectrometer

The performances of a number of commercially available components which tog ether can be employed to assemble a compact micro-XRF spectrometer were com pared. The purpose of such a spectrometer is to permit local, non-destructi ve analysis of various materials; its compact nature will allow it to be us ed on-site, i.e. at the location where the investigated objects/materials a re present rather than in a laboratory. The performances of two polycapilla ry lenses (of different manufacture) and one monocapillary tube were compar ed in combination with a mini-focus x-ray tube with Mo anode. The use of an Si-drift chamber and an Si PIN-diode detector was investigated and the ach ievable minimum detection limits for trace elements in glass and silver mat rices were determined. Finally, the effect of using mini-focus tubes (with 250 mum focus) as opposed to the use of a more conventional x-ray source (1 mm focus) on the obtained beam size was investigated. Copyright (C) 2001 J ohn Wiley & Sons, Ltd.