Hexagonal boron nitride film substrate for fabrication of nanostructures

Citation
Ks. Lee et al., Hexagonal boron nitride film substrate for fabrication of nanostructures, APPL SURF S, 169, 2001, pp. 415-419
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
169
Year of publication
2001
Pages
415 - 419
Database
ISI
SICI code
0169-4332(20010115)169:<415:HBNFSF>2.0.ZU;2-Y
Abstract
The fabrication of material with an atomic scale manipulation requires the suitable advanced substrate for epitaxial growth without the effect by the substrate lattice structure. Hexagonal boron nitride (h-BN) can be the adva nced substrate for atomic manipulation due to van der Waals' gap with littl e attractive force along to c axis. We have successfully synthesized h-BN l ayer on the co-deposited Cu/BN film by surface segregation phenomena using helicon wave plasma enhanced radio frequency (rf) magnetron sputtering syst em. Auger electron spectroscopy (AES) and X-ray photon spectroscopy (XPS) a nalysis showed that the h-BN composite segregated on the surface of Cu/BN f ilm covered over 95% of the film annealed at 900 K for 30 min. Atomic force s microscopy (AFM) and scanning tunneling microscopy (STM) analysis showed that attractive force on the film surface is uniformly distributed to an ex tent of 2nN and that the h-BN surface can be a good electric insulator like sintered h-BN plate, (C) 2001 Published by Elsevier Science B.V.