Influence of preferred orientation of lead zirconate titanate thin film onthe ferroelectric properties

Citation
Ws. Kim et al., Influence of preferred orientation of lead zirconate titanate thin film onthe ferroelectric properties, APPL SURF S, 169, 2001, pp. 549-552
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
169
Year of publication
2001
Pages
549 - 552
Database
ISI
SICI code
0169-4332(20010115)169:<549:IOPOOL>2.0.ZU;2-B
Abstract
Lead zirconate titanate (PZT) thin films with highly (1 0 0)- and (1 1 1)-p referred orientation are obtained successfully through the control of botto m electrode orientation. The films are investigated in terms of the effect of crystalline orientation on the electric and ferroelectric properties and the microstructure. The differences in electrical properties between (1 0 0)- and (1 1 1)-preferred PZT films are discussed from the viewpoint of the relationship between external field and polarization direction. From the X RD patterns of before and after fatigue, the distortion of crystal structur e in (1 0 0)-preferred PZT was observed. From all the above results, we pro posed that the grains having (1 0 0) orientation are one of the causes of f atigue. (C) 2001 Elsevier Science B.V. All nights reserved.