Ws. Kim et al., Influence of preferred orientation of lead zirconate titanate thin film onthe ferroelectric properties, APPL SURF S, 169, 2001, pp. 549-552
Lead zirconate titanate (PZT) thin films with highly (1 0 0)- and (1 1 1)-p
referred orientation are obtained successfully through the control of botto
m electrode orientation. The films are investigated in terms of the effect
of crystalline orientation on the electric and ferroelectric properties and
the microstructure. The differences in electrical properties between (1 0
0)- and (1 1 1)-preferred PZT films are discussed from the viewpoint of the
relationship between external field and polarization direction. From the X
RD patterns of before and after fatigue, the distortion of crystal structur
e in (1 0 0)-preferred PZT was observed. From all the above results, we pro
posed that the grains having (1 0 0) orientation are one of the causes of f
atigue. (C) 2001 Elsevier Science B.V. All nights reserved.