D. Rekika et al., The tolerance of PSII to high temperatures in durum wheat (T-turgidum conv. durum): genetic variation and relationship with yield under heat stress, CEREAL RES, 28(4), 2000, pp. 395-402
The yield performance of three hundred and twenty durum wheat genotypes has
been evaluated under late-planting conditions at Aleppo, Syria. Chlorophyl
l fluorometry was used to determine the in vivo tolerance of photosynthetic
membranes to high temperatures in leaves of a subset of seventeen lines wh
ich covered a wide range of yield. An important variation was noted for Tc,
the threshold temperature for photosystem-II denaturation and for Tp, the
peak temperature corresponding to maximal Fo fluorescence. A strong correla
tion was noted between the two traits (r = 0.69**). A significant correlati
on (r = 0.53*) was registered between Tc and yield under late-planting cond
itions. Earliness was also found to strongly correlate with yield (r = 0.75
***). Various durum wheat varieties and several lines derived from a cross
between the heat susceptible durum variety Korifla and the heat tolerant ac
cession T. dicoccoides 600808 were screened for the tolerance of photosynth
etic membranes to high temperatures. The potential interest of the accessio
n T. dicoccoides 600808 as source of heat tolerance has been confirmed.