The influence of high energy proton irradiation on the device properties of
InGaAs/GaAs quantum dot and quantum well lasers has been investigated. In
the regime of spontaneous emission, quantum dot lasers show a much enhanced
radiation hardness compared to quantum well lasers. manifested in a smalle
r increase of threshold current density. However, in the lasing regime the
device characteristics are similarly influenced. Internal differential quan
tum efficiencies are reduced. internal optical losses remain constant.