Long-term behavior of operational amplifiers

Citation
E. Rubiola et al., Long-term behavior of operational amplifiers, IEEE INSTR, 50(1), 2001, pp. 89-94
Citations number
12
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
50
Issue
1
Year of publication
2001
Pages
89 - 94
Database
ISI
SICI code
0018-9456(200102)50:1<89:LBOOA>2.0.ZU;2-K
Abstract
The voltage and current offsets of two typical precision operational amplif iers (OPAs) with BJT and FET input, respectively, were continuously measure d for two years. The paper presents the experiment, explains the method of data analysis, and discusses the results. The long-term stability turns out to be limited mainly by random walk processes.