High-resolution X-ray fluorescence microtomography of homogeneous samples

Citation
A. Simionovici et al., High-resolution X-ray fluorescence microtomography of homogeneous samples, IEEE NUCL S, 47(6), 2000, pp. 2736-2740
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
47
Issue
6
Year of publication
2000
Part
4
Pages
2736 - 2740
Database
ISI
SICI code
0018-9499(200012)47:6<2736:HXFMOH>2.0.ZU;2-B
Abstract
First experimental results of fluorescence microtomography with 6-mum resol ution obtained at ESRF, Grenoble, France, are described. The setup comprise s high-quality optics (monochromator, mirror, focusing lenses) coupled to t he high-energy/brilliance/coherence of the ID 22 undulator beamline. The to mographic setup allows precise measurements in the "pencil-beam" geometry. The image reconstruction is based on a modification of the algebraic recons truction method but includes simplifications of the model. The quality and precision of the two-dimensional reconstructed elemental images of a phanto m sample are encouraging. The method will be further refined and applied fo r the analysis of more complex inhomogeneous samples.