Characterization of proton damage in light-emitting diodes

Proton damage is investigated for several types of modern light-emitting di odes (LEDs), examining the damage from the standpoint of older models based on lifetime degradation;as well as the simpler method of normalized degrad ation. An empirical model is developed to describe injection-enhanced annea ling in amphoterically doped LEDs. Experimental results oh "aged" devices s how that wearout degradation does not decrease the sensitivity of de,ices t o radiation damage.