Analysis of single-event transients in analog circuits

Authors
Adell, P Schrimpf, RD Barnaby, HJ Marec, R Chatry, C Calvel, P Barillot, C Mion, O
Citation
P. Adell et al., Analysis of single-event transients in analog circuits, IEEE NUCL S, 47(6), 2000, pp. 2616-2623
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
47
Issue
6
Year of publication
2000
Part
3
Pages
2616 - 2623
Database
ISI
SICI code
0018-9499(200012)47:6<2616:AOSTIA>2.0.ZU;2-8
Abstract
A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques a re coupled in order to reproduce experimental data obtained from the Nation al Semiconductor LM124 operational amplifier and to determine the most sens itive parts of the integrated circuit, Experimental data obtained at the Ph ysical Nuclear Institute from a low-power voltage regulator that uses the L M124 are also used to illustrate the method.