A compact single ion irradiation system has been developed to examine energ
etic particle effects on materials and devices. The system has been constru
cted by use of commercially available and inexpensive standard components a
nd can be easily recomposed according to beam requirements for various irra
diation experiments. The beam adjustment was automatically performed by hel
p of a computer program based on a modified SIMPLEX method. The beam perfor
mances of the system, i.e., pulse width, the number of ions included in one
pulse and beam size were examined by use of a microchannel plate, a Si-SSD
, a CCD image sensor and a CR-39 track detector, respectively. A beam of a
single ion, 1 nsec in pulse width and several Irm in diameter has been succ
essfully produced by this system.