Reply to 'Comment on "Comparison of excess 1/f noise spectra in trimmed and untrimmed thick film resistors''

Citation
A. Peled et al., Reply to 'Comment on "Comparison of excess 1/f noise spectra in trimmed and untrimmed thick film resistors'', INT J ELECT, 88(3), 2001, pp. 321-322
Citations number
2
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
INTERNATIONAL JOURNAL OF ELECTRONICS
ISSN journal
00207217 → ACNP
Volume
88
Issue
3
Year of publication
2001
Pages
321 - 322
Database
ISI
SICI code
0020-7217(200103)88:3<321:RT'O"O>2.0.ZU;2-9
Abstract
Mercha et al. (2001) make valuable comments that provide a quantitative cla rification to the experimental results reported by us (Peled et al. 2000). There are essentially two aspects to the latter paper. First is the purely experimental results that consist of 1/f spectra, and the dependence of the noise spectral density on the volume and resistance for untrimmed and trim med thick film resistors (TFRs). The second aspect is the difficult interpr etation of the data. The experimental data clearly show that the spectral n oise density is higher in trimmed than in untrimmed TFRs. Further, the expe riments show that although the current spectral noise density S-i scales wi th the reciprocal volume for untrimmed TFRs, it does not do so for the trim med TFRs. It is true that in non-homogeneous samples one should use the Van damme-modified Hooge expression in equation (7) of Mercha et al. (2001).