A. Peled et al., Reply to 'Comment on "Comparison of excess 1/f noise spectra in trimmed and untrimmed thick film resistors'', INT J ELECT, 88(3), 2001, pp. 321-322
Mercha et al. (2001) make valuable comments that provide a quantitative cla
rification to the experimental results reported by us (Peled et al. 2000).
There are essentially two aspects to the latter paper. First is the purely
experimental results that consist of 1/f spectra, and the dependence of the
noise spectral density on the volume and resistance for untrimmed and trim
med thick film resistors (TFRs). The second aspect is the difficult interpr
etation of the data. The experimental data clearly show that the spectral n
oise density is higher in trimmed than in untrimmed TFRs. Further, the expe
riments show that although the current spectral noise density S-i scales wi
th the reciprocal volume for untrimmed TFRs, it does not do so for the trim
med TFRs. It is true that in non-homogeneous samples one should use the Van
damme-modified Hooge expression in equation (7) of Mercha et al. (2001).