MICROCAVITY EFFECTS IN THIN-FILM ELECTROLUMINESCENCE

Citation
Go. Mueller et al., MICROCAVITY EFFECTS IN THIN-FILM ELECTROLUMINESCENCE, Journal of luminescence, 72-4, 1997, pp. 1002-1004
Citations number
12
Categorie Soggetti
Optics
Journal title
ISSN journal
00222313
Volume
72-4
Year of publication
1997
Pages
1002 - 1004
Database
ISI
SICI code
0022-2313(1997)72-4:<1002:MEITE>2.0.ZU;2-B
Abstract
Putting thin-film electroluminescent device stacks of the dielectric-s andwiched type an top of a dielectric reflector modifies the spectral and angular distribution of emission by introducing the Fabry-Perot mo de structure into the final state density of the matrix elements. Expe rimental results for Fabry-Perots of about 10-quarter wavelength optic al thickness are given.