Tantalum thin-film superconducting transition edge thermometers

Authors
Mohazzab, M Mulders, N Nash, A Larson, M
Citation
M. Mohazzab et al., Tantalum thin-film superconducting transition edge thermometers, J L TEMP PH, 121(5-6), 2000, pp. 821-824
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF LOW TEMPERATURE PHYSICS
ISSN journal
00222291 → ACNP
Volume
121
Issue
5-6
Year of publication
2000
Pages
821 - 824
Database
ISI
SICI code
0022-2291(200012)121:5-6<821:TTSTET>2.0.ZU;2-Z
Abstract
Sputter deposited Ta thin films make excellent superconducting transition e dge temperature sensors. Depending on film thickness, their transition temp erature, Tc, ranges from 4.4K to as least as low as 0.5K. A figure of merit of 50K(-1) is easily achieved. The films are mechanically extremely strong , and at room temperature show minimal aging. Using a simple heat treatment technique, T-c can be tuned to the desired operating range.