A common path interferometer for testing the optical thickness of possiblybirefringent transparent substrates

Authors
Loriette, V Boccara, AC
Citation
V. Loriette et Ac. Boccara, A common path interferometer for testing the optical thickness of possiblybirefringent transparent substrates, MEAS SCI T, 12(2), 2001, pp. 201-212
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
MEASUREMENT SCIENCE & TECHNOLOGY
ISSN journal
09570233 → ACNP
Volume
12
Issue
2
Year of publication
2001
Pages
201 - 212
Database
ISI
SICI code
0957-0233(200102)12:2<201:ACPIFT>2.0.ZU;2-9
Abstract
We describe a compensated common path lateral shearing interferometer that allows fast two-dimensional measurements of the optical thickness of transp arent plates. The bench is able to provide accurate results even when heter ogeneous residual birefringence is present in the sample. This bench brings several improvements to an optical system originally built by Mr G Nomarsk i.