Test results on the silicon pixel detector for the TTF-FEL beam trajectorymonitor

Test measurements on the silicon pixel detector for the beam trajectory mon itor at the free-electron laser of the TESLA test facility are presented. T o determine the electronic noise of the detector and the read-out electroni cs and to calibrate the signal amplitude of different pixels, the 6 keV pho tons of the manganese K-alpha/K-beta line are used. Two different methods d etermine the spatial accuracy of the detector: in one setup a laser beam is focused to a straight line and moves across the pixel structure. In the ot her, the detector is scanned using a low-intensity electron beam of an elec tron microscope. Both methods show that the symmetry axis of the detector d efines a straight line within 0.4 mum. The sensitivity of the detector to l ow-energy X-rays is measured using a vacuum ultraviolet beam at the synchro tron light source HASYLAB. Additionally, the electron microscope is used to study the radiation hardness of the detector. (C) 2001 Elsevier Science B. V. AII rights reserved.