Pulse-timing effects in the far field of a passively Q-switched microchip l
aser that are caused by the changing cavity mode during pulse emission are
described. Measurements are performed on a passively Q-switched Nd:YAG lase
r that produces 3-ns pulses, and delays in pulse arrival times of up to sim
ilar to 270 ps are observed between the center and the off-axis position. T
he measured data agree well with a simple analytical model. Pulse delays of
this order are important, far instance, in high-precision range-finding ap
plications. (C) 2001 Optical Society of America OCIS codes: 140.3540, 150.5
670.