A numerical hopping model is developed to investigate the temperature depen
dence of electrical conductivity in a distribution of localized states. An
exponential energy dependence of the density-of-states (DOS) distribution (
N-0/E-0)exp(E/E-0) is assumed, together with a high DOS value (1 x 10(18)-1
x 10(21) cm(-3) eV(-1)) at the Fermi level. The low-field de conductivity
is dominated by a subset of the localized states centred at a mean transpor
t energy E-t located well above E-F; both E-t and the distribution width (D
eltaE much greater than kT) increase with increasing temperature, in the ra
nge 50-500 K. It is found that the effective activation energy E-act and ap
parent conductivity pre-factor sigma (0) both increase with increasing temp
erature. In any given temperature range, E-act decreases with increasing DO
S at E-F, while sigma (0) decreases exponentially with increasing E-0. A li
near relationship between log(sigmaT(1/2)) and T-1/4 is predicted up to hig
h temperatures with a strong positive correlation between the pre-factor si
gma (00) and the slope T-0(1/4). This model is applied to electrical transp
ort in amorphous carbon and carbon alloys where bonding and antibonding pi
orbitals produce highly localized states decoupled from extended sigma stat
es. Unlike the classical variable-range hopping at the Fermi level, this mo
del describes experimental data using physically acceptable values of N(E-F
), E-0 and the localization radius 1/gamma = 5 Angstrom. Its predictions pr
ovide a framework to understand the increased conductivity brought about by
'dopant' atom incorporation.