Influence of thermal treatment temperature and buffer layer thickness on magnetoresistance

Citation
Av. Kornilov et al., Influence of thermal treatment temperature and buffer layer thickness on magnetoresistance, PHYS LOW-D, 11, 2000, pp. 45-49
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICS OF LOW-DIMENSIONAL STRUCTURES
ISSN journal
02043467 → ACNP
Volume
11
Year of publication
2000
Pages
45 - 49
Database
ISI
SICI code
0204-3467(2000)11:<45:IOTTTA>2.0.ZU;2-F
Abstract
Three-layered Co/Cu/Co films produced by magnetron sputtering were studied. The effect of annealing and buffer layer Fe thickness were demonstrated. C orrelations between the GMR and the antiferromagnetic volume fraction in mu ltilayers were studied.