STUDY OF SUBMICRON DEPOSITS IN POLYCRYSTALLINE MATERIALS USING THE INTERNAL-FRICTION METHOD

Authors
ANDREEV YN YAROSLAVTSEV NP BESTAEV MV DIMITROV DT MOSHNIKOV VA TAIROV YM
Citation
Yn. Andreev et al., STUDY OF SUBMICRON DEPOSITS IN POLYCRYSTALLINE MATERIALS USING THE INTERNAL-FRICTION METHOD, Semiconductors, 31(7), 1997, pp. 714-715
Citations number
15
Categorie Soggetti
Physics, Condensed Matter
Journal title
Semiconductors → ACNP
ISSN journal
10637826
Volume
31
Issue
7
Year of publication
1997
Pages
714 - 715
Database
ISI
SICI code
1063-7826(1997)31:7<714:SOSDIP>2.0.ZU;2-T
Abstract
An internal friction method is proposed for investigating the kinetics of impurity deposits on grain surfaces in polycrystalline samples. Th e possibilities of the method have been tested on polycrystalline, gas -sensitive, tellurium-doped layers of tin dioxide. (C) 1997 American I nstitute of Physics.