X-ray multilayer optics: growth and characterization

Authors
Lodha, GS Raghuvanshi, VK Modi, MH Tripathi, P Verma, A Nandedkar, RV
Citation
Gs. Lodha et al., X-ray multilayer optics: growth and characterization, VACUUM, 60(4), 2001, pp. 385-388
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
VACUUM
ISSN journal
0042207X → ACNP
Volume
60
Issue
4
Year of publication
2001
Pages
385 - 388
Database
ISI
SICI code
0042-207X(200103)60:4<385:XMOGAC>2.0.ZU;2-6
Abstract
Growth of X-ray multilayer optics is done using an ultra high-vacuum electr on beam deposition. High-vacuum reflectometer station on Indus-l synchrotro n source is described. Representative studies on Mo/C X-ray multilayers are presented. (C) 2001 Elsevier Science Ltd. All rights reserved.