The nature of 1/f noise, which appears in strongly doped n-type GaAs (
electron density n(0) similar or equal to 10(17) cm(-3)) under band-ba
nd illumination, has been investigated by measuring the low-frequency
noise under high geometric magnetoresistance conditions. It is shown t
hat such noise is of a volume nature and is due to carrier number (and
not mobility) fluctuations. It is shown experimentally for the first
time that surface noise can be distinguished from volume noise by perf
orming measurements under high geometric magnetoresistance conditions.
(C) 1997 American Institute of Physics.