Analytic thermal modeling for dc-to-midrange modulation frequency responses of thin-film high-T-c superconductive edge-transition bolometers

Authors
Citation
M. Fardmanesh, Analytic thermal modeling for dc-to-midrange modulation frequency responses of thin-film high-T-c superconductive edge-transition bolometers, APPL OPTICS, 40(7), 2001, pp. 1080-1088
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
40
Issue
7
Year of publication
2001
Pages
1080 - 1088
Database
ISI
SICI code
0003-6935(20010301)40:7<1080:ATMFDM>2.0.ZU;2-#
Abstract
Thin-film superconductive edge-transition bolometers are modeled with a one -dimensional analytic thermal model with joule heating, film and substrate materials, and the physical interface effects taken into consideration. The results from the model agree well with the experimental results of samples made of large-meander-line Yba(2)Cu(3)O(7--x) films on crystalline SrTiO3, LaAlO3, and MgO substrates up to 100 kHz, the limits of the experimental s etup. Compared with the results of the SrTiO3 substrate samples, the result s from the model of the LaAlO3 and the MgO substrate samples deviate slight ly from the measured values at very low modulation frequencies (below simil ar to 10 Hz). The deviation increases for higher thermal-conductive substra te materials. When the model was used, the substrate absorption and the the rmal parameters of the devices could also be investigated. (C) 2001 Optical Society of America OCIS codes: 230.0040, 040.3060.