Schottky contacts on amorphous carbon: A more reliable approach

Citation
S. Paul et Fj. Clough, Schottky contacts on amorphous carbon: A more reliable approach, APPL PHYS L, 78(10), 2001, pp. 1415-1417
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
10
Year of publication
2001
Pages
1415 - 1417
Database
ISI
SICI code
0003-6951(20010305)78:10<1415:SCOACA>2.0.ZU;2-#
Abstract
It is considered impossible to form Schottky contacts on amorphous hydrogen ated carbon (a-C:H). Taking the lead from our earlier work in which we repo rt the formation of Schottky contacts on radio frequency plasma enhanced ch emical vapor deposition (rf PECVD) grown a-C:H films, here we present a way of confining the semiconductor-like parts of a-C:H to particular regions o f the films. Thus, the location and formation of Schottky contacts in a-C:H , are rendered more predictable. This was achieved by depositing a-C:H on m etal-patterned Si substrates. (C) 2001 American Institute of Physics.