X-ray reflectivity and nanotribological study of deposition-energy-dependent thin CNx overcoats on CoCr magnetic films

Authors
Liu, WJ Zhou, JN Rar, A Barnard, JA
Citation
Wj. Liu et al., X-ray reflectivity and nanotribological study of deposition-energy-dependent thin CNx overcoats on CoCr magnetic films, APPL PHYS L, 78(10), 2001, pp. 1427-1429
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
10
Year of publication
2001
Pages
1427 - 1429
Database
ISI
SICI code
0003-6951(20010305)78:10<1427:XRANSO>2.0.ZU;2-9
Abstract
Using a combination of high-resolution x-ray reflectivity (XRR), nanotribol ogical, and x-ray photoelectron spectroscopy (XPS) techniques, a thorough d escription of the structural parameters of ultrathin CNx overcoats on CoCr magnetic films is obtained. In addition, the tribological performance as a function of deposition energy is shown to correlate well with trends found by XRR and XPS. (C) 2001 American Institute of Physics.