We studied the effect of surface enlargement on the efficiency of a muon (m
u (+)) moderator by comparing the flux of epithermal mu (+) emerging from a
solid Ar (s-Ar) layer deposited on a Rat Al substrate with the fluxes from
an Ar layer deposited on gratings manufactured in Si and Ag substrates. We
developed a simple replication technique to emboss a Si g-rating into a th
in Ag foil, where the gratings consist of V-shaped grooves with 20 mum dept
h and ridge distance of 30 mum on an area of 30 x 30 mm(2), We obtain a gai
n in epithermal mu (+) flux of 1.5 with respect to that of a Rat moderator
geometry. The 15% reduction with respect to the geometrical enlargement fac
tor of 1.73 is due to mu (+) absorption losses in the V-groove walls. The d
ata imply a nearly isotropic angular distribution of epithermal mu (+) insi
de the s-Ar moderator and a reflection coefficient of about 80% for epither
mal mu (+) impinging on s-Ar. (C) 2001 Elsevier Science B.V. All rights res
erved.