Study on the structure and properties of ZrO2 buffer layers on stainless steel by XRD, IR and AES

Citation
Y. Yu et al., Study on the structure and properties of ZrO2 buffer layers on stainless steel by XRD, IR and AES, APPL SURF S, 172(3-4), 2001, pp. 260-264
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
172
Issue
3-4
Year of publication
2001
Pages
260 - 264
Database
ISI
SICI code
0169-4332(20010315)172:3-4<260:SOTSAP>2.0.ZU;2-N
Abstract
ZrO2 buffer layers were successfully dip-coated on stainless steel(SS) foil s via a sol-gel process, using 30 mol% SiO2 as a stabilizing agent and zirc onyl chloride octahydrate (ZrOCl2.8H(2)O) as the precursor The buffer layer was characterized by X-ray diffraction analysis, Fourier transform-infrare d spectroscopy, Auger electron spectroscopy, and scanning electron microsco py. The introduction of SiO2 retarded ZrO2 phase transformation from tetrag onal to monoclinic. The normal emittances of the Au/ZrO2/SS foils before an d after heat-treatment in air at 850 degreesC are 0.038 and 0.043, respecti vely. The ZrO2 buffer layer effectively suppresses interdiffusion between t he gold film and the SS substrate at high temperature. (C) 2001 Elsevier Sc ience B.V. All rights reserved.