Planar-type ferromagnetic tunnel junctions fabricated by atomic force microscope for nonvolatile memory

Citation
Y. Takemura et J. Shirakashi, Planar-type ferromagnetic tunnel junctions fabricated by atomic force microscope for nonvolatile memory, JPN J A P 1, 40(1), 2001, pp. 128-129
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
1
Year of publication
2001
Pages
128 - 129
Database
ISI
SICI code
Abstract
A nonvolatile magnetic memory based on a planar-type ferromagnetic single e lectron transistor is proposed. A sense signal dominated by a co-tunneling current under Coulomb blockade enables a low-power operation of the memory. The small tunnel junctions required for a room temperature operation of th e device can be consisted of planar-type junctions fabricated by a nano-oxi dation technique using atomic force microscope.