Spatial property of formed patterns depending on focus condition in a two-dimensional optoelectronic feedback system

The spatial properties of a pattern generated in an optoelectronic system c omposed of an electronically addressable spatial light modulator, a detecto r array, and two-dimensional optical feedback are experimentally investigat ed. The square-root dependence of the fundamental spatial frequency on the positive and negative deviations from the in-focus condition of the optical feedback is demonstrated under conditions of the inversion property of the spatial light modulator. The optoelectronic system has a serial process, b ut its spatial properties are almost equivalent to the spatial properties o f an all-optical system based on an optically addressed spatial light modul ator. Patterns generated by variation of the frame rate of the optoelectron ic system are also demonstrated.