Yj. Lee et Ys. Kwon, Fabrication of novel active resistor using selective metal organic chemical vapor deposition (MOCVD) for monolithic integration, JPN J A P 2, 40(2A), 2001, pp. L89-L90
Using selective epitaxial growth, we fabricated an active resistor in the f
loated electron channel field effect transistor(FECFET) structure. Compared
to the active resistor in the metal semiconductor FET(MESFET) structure, i
t has large sheet resistance, depending on the number of stripes and etchin
g time. For two SiO2 stripes, it is 600 Omega /w = 50 mum and for twenty Si
O2 stripes, its sheet resistance can reach 6000 Omega/rectangle. Under ligh
t illumination, its current increases nonlinearly with the input light powe
r like two-terminal FET without a gate.