Fabrication of novel active resistor using selective metal organic chemical vapor deposition (MOCVD) for monolithic integration

Authors
Citation
Yj. Lee et Ys. Kwon, Fabrication of novel active resistor using selective metal organic chemical vapor deposition (MOCVD) for monolithic integration, JPN J A P 2, 40(2A), 2001, pp. L89-L90
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
2A
Year of publication
2001
Pages
L89 - L90
Database
ISI
SICI code
Abstract
Using selective epitaxial growth, we fabricated an active resistor in the f loated electron channel field effect transistor(FECFET) structure. Compared to the active resistor in the metal semiconductor FET(MESFET) structure, i t has large sheet resistance, depending on the number of stripes and etchin g time. For two SiO2 stripes, it is 600 Omega /w = 50 mum and for twenty Si O2 stripes, its sheet resistance can reach 6000 Omega/rectangle. Under ligh t illumination, its current increases nonlinearly with the input light powe r like two-terminal FET without a gate.