Quasi-static propagation of subinterfacial cracks

Citation
H. Lee et S. Krishnaswamy, Quasi-static propagation of subinterfacial cracks, J APPL MECH, 67(3), 2000, pp. 444-452
Citations number
43
Categorie Soggetti
Mechanical Engineering
Journal title
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME
ISSN journal
00218936 → ACNP
Volume
67
Issue
3
Year of publication
2000
Pages
444 - 452
Database
ISI
SICI code
0021-8936(200009)67:3<444:QPOSC>2.0.ZU;2-D
Abstract
The problem of quasi-static crack propagation in a three-point bend specime n containing an initial crack that is parallel to and offset from a bimater ial interface is considered. An approximate dislocation-based fracture mode l is used to identify conditions under which such cracks are attracted to o r repelled by the interface. Possible configurations (material/geometry) wh ere such subinterfacial cracks experience pure mode I conditions are determ ined. Experimental results are presented showing quasi-static crack propaga tion of subinterfacial cracks for three regimes: (attractive) into the inte rface; (repulsive) away from the interface; as well as (equilibrium) parall el to the interface.